Browsing by author "Cressler, John D."
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Effects of halo doping and Si capping layer thickness on total-dose effects in Ge p-MOSFETs
Arora, Rajan; Simoen, Eddy; Zhang, En Xia; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Galloway, Kenneth F.; Choi, Bo K.; Mitard, Jerome; Meuris, Marc; Claeys, Cor; Madan, Anuj; Cressler, John D. (2010)