Browsing by author "Toledano Luque, Maria"
Now showing items 61-80 of 94
-
Reliability aware design: from single defect physics to circuit simulations
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter; Grasser, Tibor; Roussel, Philippe; Groeseneken, Guido (2012) -
Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs
Spessot, Alessio; Ritzenthaler, Romain; Schram, Tom; Aoulaiche, Marc; Cho, Moon Ju; Toledano Luque, Maria; Horiguchi, Naoto; Fazan, Pierre (2015) -
Reliability in gate first and gate last Ultra-Thin-EOT gate stacks assessed with CV-eMSM BTI characterization
Bury, Erik; Kaczer, Ben; Toledano Luque, Maria; Arimura, Hiroaki; Ragnarsson, Lars-Ake; Veloso, Anabela; Chew, Soon Aik; Togo, Mitsuhiro; Schram, Tom; Groeseneken, Guido (2012) -
Reliability of SiGe Channel MOS
Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Eneman, Geert; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Witters, Liesbeth; Hikavyy, Andriy; Hellings, Geert; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Grasser, T.; Heyns, Marc; Groeseneken, Guido (2012) -
Reliability of SiGe channel MOS
Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Eneman, Geert; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Grasser, Tibor; Witters, Liesbeth; Hellings, Geert; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Heyns, Marc; Groeseneken, Guido (2012-10) -
Resolving fast VtH transients after program/erase of flash memory stacks and their relation to electron and hole defects
Toledano Luque, Maria; Degraeve, Robin; Zahid, Mohammed; Kaczer, Ben; Kittl, Jorge; Jurczak, Gosia; Groeseneken, Guido; Van Houdt, Jan (2009) -
Response of a single trap to AC negative bias temperature stress
Toledano Luque, Maria; Kaczer, Ben; Roussel, Philippe; Grasser, Tibor; Wirth, G.I.; Franco, Jacopo; Vrancken, Christa; Horiguchi, Naoto; Groeseneken, Guido (2011) -
RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application
Cano de Andrade, Gloria; Toledano Luque, Maria; Fourati, Fatma; Degraeve, Robin; Martino, Joao Antonio; Claeys, Cor; Simoen, Eddy; Van den Bosch, Geert; Van Houdt, Jan (2013) -
RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application
Caño de Andrade, Maria Glória; Toledano Luque, Maria; Fourati, Fatma; Degraeve, Robin; Martino, Joao Antonio; Claeys, Cor; Simoen, Eddy; Van den Bosch, Geert; Van Houdt, Jan (2013) -
Scaling of BTI reliability in presence of Time-zero Variability – Pathfinding from planar FET to advanced 3-D FinFET nodes
Kukner, Halil; Weckx, Pieter; Franco, Jacopo; Toledano Luque, Maria; Cho, Moon Ju; Kaczer, Ben; Raghavan, Praveen; Jang, Doyoung; Miyaguchi, Kenichi; Garcia Bardon, Marie; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
SiGe channel technology: superior reliability toward ultra-thin EOT devices – Part II: time-dependent variability in nanoscaled devices and other reliability issues
Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Kauerauf, Thomas; Mitard, Jerome; Witters, Liesbeth; Grasser, Tibor; Groeseneken, Guido (2013) -
Spectroscopic study of polysilicon traps by means of fast capacitance transients
Toledano Luque, Maria; Tang, Baojun; Degraeve, Robin; Kaczer, Ben; Simoen, Eddy; Van Houdt, Jan; Groeseneken, Guido (2012) -
Spectroscopic study of polysilicon traps by means of fast capacitance transients
Toledano Luque, Maria; Tang, Baojun; Degraeve, Robin; Kaczer, Ben; Simoen, Eddy; Van Houdt, Jan; Groeseneken, Guido (2013) -
Statistical characterization of current paths in narrow poly-si channels
Degraeve, Robin; Toledano Luque, Maria; Suhane, Amit; Van den Bosch, Geert; Arreghini, Antonio; Tang, Baojun; Kaczer, Ben; Roussel, Philippe; Kar, Gouri Sankar; Van Houdt, Jan; Groeseneken, Guido (2011) -
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Tang, Baojun; Toledano Luque, Maria; Zhang, W.D.; Van den Bosch, Geert; Degraeve, Robin; Zhang, J.F.; Van Houdt, Jan (2013) -
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Tang, Baojun; Toledano Luque, Maria; Zhang, W.D.; Van den Bosch, Geert; Degraeve, Robin; Zhang, J.F.; Van Houdt, Jan (2013) -
Statistical distribution of defect parameters
Kaczer, Ben; Toledano Luque, Maria; Franco, Jacopo; Weckx, Pieter (2014) -
Statistical spectroscopy of switching traps in deeply scaled vertical poly-Si channel for 3D memories
Toledano Luque, Maria; Degraeve, Robin; Roussel, Philippe; Luong, Vu; Tang, Baojun; Lisoni, Judit; Tan, Chi Lim; Arreghini, Antonio; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2013) -
Superior reliability and reduced time-dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications
Franco, Jacopo; Kaczer, Ben; Mitard, Jerome; Toledano Luque, Maria; Crupi, Felice; Eneman, Geert; Roussel, Philippe; Grasser, Tibor; Cho, Moon Ju; Kauerauf, Thomas; Witters, Liesbeth; Hellings, Geert; Ragnarsson, Lars-Ake; Horiguchi, Naoto; Heyns, Marc; Groeseneken, Guido (2012) -
Superior reliability of high mobility (Si)Ge channel pMOSFETs
Franco, Jacopo; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Cho, Moon Ju; Kauerauf, Thomas; Mitard, Jerome; Eneman, Geert; Witters, Liesbeth; Grasser, Tibor; Groeseneken, Guido (2013)