Browsing by author "Kubicek, Stefan"
Now showing items 101-120 of 181
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Modeling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance
Lujan, Guilherme; Ragnarsson, Lars-Ake; Kubicek, Stefan; De Gendt, Stefan; Heyns, Marc; De Meyer, Kristin (2004) -
Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance
Lujan, Guilherme; Magnus, Wim; Ragnarsson, Lars-Ake; Kubicek, Stefan; De Gendt, Stefan; Heyns, Marc; De Meyer, Kristin (2005) -
Modulation of the Ni FUSI workfunction by Yb doping: from midgap to n-type band-edge
Yu, HongYu; Chen, J.D.; Li, M.F.; Lee, S.J.; Kwong, D.L.; van Dal, Marc; Kittl, Jorge; Lauwers, Anne; Augendre, Emmanuel; Kubicek, Stefan; Zhao, Chao; Bender, Hugo; Brijs, Bert; Geenen, Luc; Benedetti, Alessandro; Absil, Philippe; Jurczak, Gosia; Biesemans, Serge (2005) -
Moving spins from lab to fab: A silicon-based platform for quantum computing device technologies
Govoreanu, Bogdan; Kubicek, Stefan; Jussot, Julien; Chan, BT; Dumoulin Stuyck, Nard; Mohiyaddin, Fahd Ayyalil; Li, Roy; Simion, George; Ivanov, Tsvetan; Mocuta, Dan; Lee, James; Radu, Iuliana (2019) -
Multiphysics simulation & design of silicon quantum dot Qubit devices
Mohiyaddin, Fahd Ayyalil; Simion, George; Dumoulin Stuyck, Nard; Li, Roy; Ciubotaru, Florin; Eneman, Geert; Bufler, Fabian; Kubicek, Stefan; Jussot, Julien; Chan, BT; Ivanov, Tsvetan; Spessot, Alessio; Matagne, Philippe; Lee, James; Govoreanu, Bogdan; Radu, Iuliana (2019) -
Multiple-Vt FinFET devices through La2O3 dielectric capping
Witters, Liesbeth; Veloso, Anabela; Ferain, Isabelle; Demand, Marc; Collaert, Nadine; Son, Nak Jin; Adelmann, Christoph; Meersschaut, Johan; Vos, Rita; Rohr, Erika; Wada, Masayuki; Schram, Tom; Kubicek, Stefan; De Meyer, Kristin; Biesemans, Serge; Jurczak, Gosia (2008) -
New architectures for deep submicron MOSFETs
De Meyer, Kristin; Biesemans, Serge; Collaert, Nadine; Kubicek, Stefan; Verheyen, P. (1998) -
New CoSi2 SALICIDE technology for 0.1 µm processes and below
Wang, Qingfeng; Maex, Karen; Kubicek, Stefan; Jonckheere, Rik; Kerkwijk, Bas; Verbeeck, Rita; Biesemans, Serge; De Meyer, Kristin (1995) -
New current-defined threshold voltage model from 2D potential distribution calculations in MOSFETs
Biesemans, Serge; Kubicek, Stefan; De Meyer, Kristin (1996) -
Ni-FUSI on high-k as a candidate for 65nm LSTP CMOS
Kubicek, Stefan; Veloso, Anabela; Kottantharayil, Anil; Hayashi, Shigenori; Yamamoto, Kazuhiko; Mitsuhashi, Riichirou; Kittl, Jorge; Lauwers, Anne; Horii, S.; Harada, Y.; Kubota, M.; Niwa, Masaaki; De Gendt, Stefan; Heyns, Marc; Jurczak, Gosia; Biesemans, Serge (2005-04) -
Nitrogen profile and dielectric cap layer (Al2O3, Dy2O3, La2O3) engineering on Hf-silicate
Cho, Hag-Ju; Yu, HongYu; Ragnarsson, Lars-Ake; Chang, Vincent; Schram, Tom; O'Sullivan, Barry; Kubicek, Stefan; Mitsuhashi, Riichirou; Akheyar, Amal; Van Elshocht, Sven; Witters, Thomas; Delabie, Annelies; Adelmann, Christoph; Rohr, Erika; Singanamalla, Raghunath; Chang, Shou-Zen; Swerts, Johan; Lehnen, Peer; De Gendt, Stefan; Absil, Philippe; Biesemans, Serge (2007) -
NO post annealed oxide versus re-oxidised NO oxide
Kubicek, Stefan; Schaekers, Marc; De Keersgieter, An; Augendre, Emmanuel; Badenes, Gonçal; De Meyer, Kristin (2000) -
Novel junction design for NMOS Si bulk-FinFETs with extension doping by phosphorus doped silicate glass
Sasaki, Yuichiro; Ritzenthaler, Romain; Kimura, Y.; De Roest, David; Shi, Xiaoping; De Keersgieter, An; Kim, Min-Soo; Chew, Soon Aik; Kubicek, Stefan; Schram, Tom; Kikuchi, Yoshiaki; Demuynck, Steven; Veloso, Anabela; Vandervorst, Wilfried; Horiguchi, Naoto; Mocuta, Dan; Mocuta, Anda; Thean, Aaron (2015) -
Novel process to pattern selectively dual dielectric capping layers using soft-mask only
Schram, Tom; Kubicek, Stefan; Rohr, Erika; Brus, Stephan; Vrancken, Christa; Chang, Shou-Zen; Chang, V.S.; Mitsuhashi, Riichiru; Okuno, Yasutoshi; Akheyar, Amal; Cho, Hag-Ju; Hooker, J.C.; Paraschiv, Vasile; Vos, Rita; Sebaai, Farid; Ercken, Monique; Kelkar, Prasad; Delabie, Annelies; Adelmann, Christoph; Witters, Thomas; Ragnarsson, Lars-Ake; Kerner, Christoph; Chiarella, Thomas; Aoulaiche, Marc; Cho, Moon Ju; Kauerauf, Thomas; De Meyer, Kristin; Lauwers, Anne; Hoffmann, Thomas Y.; Absil, Philippe; Biesemans, Serge (2008) -
On the difference in threshold voltage dependence on channel length for boron and indium channel nMOS transistors
Kubicek, Stefan; Jeong-Ho, Lyu; van Meer, Hans; De Meyer, Kristin (1999) -
On the impact of indium and boron on the Reversed Narrow-Channel Effects (RNCE) in BULK and SOI MOSFETs
van Meer, Hans; Lyu, Jeong-ho; Kubicek, Stefan; De Meyer, Kristin (1999) -
On the use of indium and gallium as p-type dopants in Si 0.1 μm MOSFETs
Biesemans, Serge; Kubicek, Stefan; Van Laer, Joris; Loosen, Fred; Geenen, Luc; Maex, Karen; De Meyer, Kristin (1995) -
One junction approach to make deep submicron PMOSFETs for low power applications
Kubicek, Stefan; Biesemans, Serge; De Meyer, Kristin (1996) -
Optical testing of submicron-technology MOSFETs and bipolar transistors
Pogany, D.; Fürböck, C.; Seliger, N.; Habas, Predrag; Gornik, E.; Kubicek, Stefan; Decoutere, Stefaan (1997) -
Optimization of nMOS high-frequency transistor characteristics for application in MMIC's
van Meer, Hans; Kubicek, Stefan; Schreurs, Dominique; Lyu, Jeong-ho; Nauwelaers, Bart; De Meyer, Kristin (1998)