Browsing by author "Groeseneken, Guido"
Now showing items 21-40 of 1150
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A comprehensive LER-aware TDDB lifetime model for advanced Cu interconnects
Stucchi, Michele; Roussel, Philippe; Tokei, Zsolt; Demuynck, Steven; Groeseneken, Guido (2011) -
A comprehensive model for breakdown mechanism in HfO2 high-k gate stacks
Ranjan, R.; Pey, K.L.; Tung, C.H.; Tang, L.J.; Groeseneken, Guido; Bera, L.K.; De Gendt, Stefan (2004) -
A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectrics
Amat, Esteve; Kauerauf, Thomas; Rodríguez, Rosana; Nafría, Montse; Aymerich, Xavier; Degraeve, Robin; Groeseneken, Guido (2013) -
A consistent model for oxide trap profiling with the trap spectroscopy by charge injection and sensing (TSCIS) technique
Cho, Moon Ju; Degraeve, Robin; Roussel, Philippe; Govoreanu, Bogdan; Kaczer, Ben; Zahid, Mohammed; Simoen, Eddy; Arreghini, Antonio; Jurczak, Gosia; Van Houdt, Jan; Groeseneken, Guido (2010) -
A consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling
Roussel, Philippe; Degraeve, Robin; Sahhaf, Sahar; Groeseneken, Guido (2007) -
A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxides
Degraeve, Robin; Groeseneken, Guido; Bellens, Rudi; Depas, Michel; Maes, Herman (1995) -
A DC-to-22 GHz 8.4mW compact dual-feedback wideband LNA in 90 nm digital CMOS
Okushima, Mototsugu; Borremans, Jonathan; Linten, Dimitri; Groeseneken, Guido (2009-06) -
A disorder-controlled-kinetics model for Negative Bias Temperature Instability and its experimental verification
Kaczer, Ben; Arkhipov, Vladimir; Degraeve, Robin; Collaert, Nadine; Groeseneken, Guido; Goodwin, Michael (2005-04) -
A fast and flexible thermal simulation tool validated on smart power devices
Desoete, B.; Moens, P.; Driessens, Evelien; Elattari, Brahim; Van den Bosch, Geert; Gillon, R.; Groeseneken, Guido (2005-05) -
A fast and simple methodology for lifetime prediction of ultra-thin oxides
Nigam, Tanya; Degraeve, Robin; Groeseneken, Guido; Maes, Herman (1999) -
A fully-integrated method for RTN parameter extraction
Simicic, Marko; Morrison, Sebastien; Parvais, Bertrand; Weckx, Pieter; Kaczer, Ben; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Nomoto, Kazuki; Ono, Makoto; Linten, Dimitri; Verkest, Diederik; Wambacq, Piet; Groeseneken, Guido; Gielen, Georges (2017) -
A high resolution method for measuring hot carrier degradation in matched transistor pairs
Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido (1997) -
A high resolution method for measuring hot carrier degradation in matched transistor pairs
Dreesen, R.; De Ceuninck, Ward; De Schepper, Luc; Groeseneken, Guido (1997) -
A low cost 90nm RF-CMOS platform for record RF circuit performance
Jeamsaksiri, Wutthinan; Linten, Dimitri; Thijs, Steven; Carchon, Geert; Ramos, Javier; Mercha, Abdelkarim; Sun, Xiao; Soussan, Philippe; Dehan, Morin; Chiarella, Thomas; Venegas, Rafael; Subramanian, Vaidy; Scholten, A.; Wambacq, Piet; Velghe, Rudolf; Mannaert, Geert; Heylen, Nancy; Verbeeck, Rita; Boullart, Werner; Heyvaert, Ilse; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Debusschere, Ingrid; Biesemans, Serge; Decoutere, Stefaan (2005-06) -
A model determining optimal doping concentration and material's band gap of tunnel field-effect transistors
Vandenberghe, William; Verhulst, Anne; Kao, Frank; De Meyer, Kristin; Soree, Bart; Magnus, Wim; Groeseneken, Guido (2012) -
A model study of the hot-carrier problem in LDD and overlapped LDD MOSFETs
Habas, Predrag; Bellens, Rudi; Groeseneken, Guido (1995) -
A multi-bits/cell PUF using analog breakdown positions in CMOS
Chuang, Kent; Bury, Erik; Degraeve, Robin; Kaczer, Ben; Kallstenius, Thomas; Groeseneken, Guido; Linten, Dimitri; Verbauwhede, Ingrid (2018) -
A new analytic model for the description of the intrinsic oxide breakdown statistics of ultra-thin oxides
Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A new breakdown failure mechanism in HfO2 gate dielectrics
Ranjan, R.; Pey, K.L.; Tang, L.J.; Tung, C.H.; Groeseneken, Guido; Radhakrishnan, M.K.; Kaczer, Ben; Degraeve, Robin; De Gendt, Stefan (2004) -
A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Dreesen, R.; Croes, Kris; Manca, Jean; De Ceuninck, Ward; De Schepper, Luc; Pergoot, A.; Groeseneken, Guido (2001)