Browsing by author "Clarysse, Trudo"
Now showing items 21-40 of 213
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Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Takeuchi, Shotaro; Shimura, Yosuke; Nishimura, Tsuyoshi; Vincent, Benjamin; Eneman, Geert; Clarysse, Trudo; Demeulemeester, Jelle; Temst, Kristiaan; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Nakatsuka, Osamu; Sakai, A.; Zaima, Shigeaki (2010-10) -
Automatic generation of shallow electrically active dopant profiles from spreading resistance measurements
Clarysse, Trudo; Vandervorst, Wilfried (1994) -
Bias-induced junction displacements in scanning spreading resistance microscopy and scanning capacitance microscopy
Eyben, Pierre; Duhayon, Natasja; Clarysse, Trudo; Vandervorst, Wilfried (2003) -
Bias-induced junction displacements in SSRM and SCM
Eyben, Pierre; Duhayon, Natasja; Clarysse, Trudo; Vandervorst, Wilfried (2001) -
Carrier illumination as a tool to probe implant dose and electrical activation
Vandervorst, Wilfried; Clarysse, Trudo; Brijs, Bert; Loo, Roger; Peytier, Ivan; Pawlak, Bartek; Budiarto, E.; Borden, P. (2003) -
Carrier illumination for characterization of ultra-shallow doping profiles
Clarysse, Trudo; Lindsay, Richard; Vandervorst, Wilfried; Budiarto, E.; Borden, Peter (2003) -
Carrier illumination for characterization of ultrashallow doping profiles
Clarysse, Trudo; Lindsay, Richard; Vandervorst, Wilfried; Budiarto, E.; Borden, P. (2004-02) -
Carrier illumination for monitoring of CMOS ultra-shallow junctions
Clarysse, Trudo; Vandervorst, Wilfried; Lindsay, Richard; Borden, P.; Budiarto, E. (2002) -
Carrier Profile Determination in Device Structures using AFM-Based Methods
Vandervorst, Wilfried; De Wolf, Peter; Clarysse, Trudo; Trenkler, Thomas; Hellemans, L.; Snauwaerts, Jan; Raineri, Vito (1995) -
Carrier spilling revisited: on-bevel junction behavior of different electrical depth profiling techniques
Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2003) -
Carrier spilling revisited: the on-bevel junction behavior of different electrical depth profiling techniques
Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2001) -
Characterization of a point-contact on silicon using force microscopy-supported resistance measurements
De Wolf, Peter; Snauwaerts, Jan; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1995) -
Characterization of electrically active dopant profiles with the spreading resistance probe
Clarysse, Trudo; Vanhaeren, Danielle; Hoflijk, Ilse; Vandervorst, Wilfried (2004) -
Characterization of epitaxial Si:C:P and SI:P layers for source/drain formation in advanced bulk FinFETs
Rosseel, Erik; Profijt, Harald; Hikavyy, Andriy; Tolle, John; Kubicek, Stefan; Mannaert, Geert; L'abbe, Caroline; Wostyn, Kurt; Horiguchi, Naoto; Clarysse, Trudo; Parmentier, Brigitte; Dhayalan, Sathish Kumar; Bender, Hugo; Maes, Jan; Mehta, Sandeep; Loo, Roger (2014-10) -
Characterization of epitaxial Si:C:P and Si:P layers for source/drain formation in advanced bulk finFETs
Rosseel, Erik; Profijt, Harald; Hikavyy, Andriy; Tolle, John; Kubicek, Stefan; Mannaert, Geert; L'abbe, Caroline; Wostyn, Kurt; Horiguchi, Naoto; Clarysse, Trudo; Parmentier, Brigitte; Dhayalan, Sathish Kumar; Bender, Hugo; Maes, Jan Willem; Loo, Roger (2014-10) -
Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors
Vincent, Benjamin; Shimura, Y.; Takeuchi, Shotaro; Nishimura, T.; Eneman, Geert; Firrincieli, Andrea; Demeulemeester, Jelle; Vantomme, Andre; Clarysse, Trudo; Nakatsuka, O.; Zaima, S.; Dekoster, Johan; Caymax, Matty; Loo, Roger (2011) -
Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors
Vincent, Benjamin; Shimura, Y.; Takeuchi, S.; Nishimura, T.; Demeulemeester, J.; Eneman, Geert; Clarysse, Trudo; Vantomme, Andre; Nakatsuka, O.; Zaima, S.; Dekoster, Johan; Caymax, Matty; Loo, Roger (2010) -
Chemical and electrical dopant profiling for P-type junctions formed by solid phase epitaxial regrowth
Pawlak, Bartek; Lindsay, Richard; Kittl, Jorge; Vandervorst, Wilfried; Clarysse, Trudo; Hoflijk, Ilse; Dieu, B.; Geenen, Luc; Brijs, Bert (2003) -
Chemical and electrical dopants profile evolution during solid phase epitaxial regrowth
Pawlak, Bartek; Lindsay, Richard; Surdeanu, Radu; Dieu, Bjorn; Geenen, Luc; Hoflijk, Ilse; Richard, Olivier; Duffy, Ray; Clarysse, Trudo; Brijs, Bert; Vandervorst, Wilfried (2004) -
Cluster formation during annealing of ultra-low-energy boron-implanted silicon
Collart, E. J. H.; Murrell, A. J.; Foad, M. A.; van den Berg, J. A.; Zhang, S.; Armour, D.; Goldberg, R. D.; Wang, T. S.; Cullis, A. G.; Clarysse, Trudo; Vandervorst, Wilfried (2000)