Browsing by author "Maes, Herman"
Now showing items 21-40 of 294
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A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown
Degraeve, Robin; Ogier, Jean-Luc; Bellens, Rudi; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1998) -
A new physically-based model for temperature acceleration of time-to-breakdown
Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Degraeve, Robin; De Blauwe, Jan; Ogier, Jean-Luc; Roussel, Philippe; Groeseneken, Guido; Maes, Herman (1996) -
A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
De Blauwe, Jan; Van Houdt, Jan; Wellekens, Dirk; Degraeve, Robin; Roussel, Philippe; Haspeslagh, Luc; Deferm, Ludo; Groeseneken, Guido; Maes, Herman (1996) -
A new statistical model for fitting bimodal oxide breakdown distributions at different field conditions
Degraeve, Robin; Roussel, Philippe; Ogier, Jean-Luc; Groeseneken, Guido; Maes, Herman (1996) -
A reliability study of titanium silicide lines using micro-raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A reliability study of titanium silicide lines using micro-Raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A review of recent work on stresses and strains in semiconductor heterostructures
Jain, Suresh; Willander, M.; Pinardi, Kuntjoro; Maes, Herman (1997) -
A simple and accurate deep submicron mismatch model
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2000) -
A simple characterization method for MOS transistor matching in deep submicron technologies
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2001) -
A simple, cost effective and very sensitive alternative for photon emission spectroscopy
Rasras, Mahmoud; De Wolf, Ingrid; Groeseneken, Guido; Maes, Herman; Vanhaeverbeke, S.; De Pauw, P. (1997) -
A time independent model for simulating switching current and hysteresis characteristics of PZT thin-film ferroelectric capacitors
Bartic, Andrei; Wouters, Dirk; Maes, Herman (1998) -
Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?
Kauerauf, Thomas; Degraeve, Robin; Zahid, Mohammed; Cho, Moon Ju; Kaczer, Ben; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; De Gendt, Stefan (2005) -
Addressing key concerns for implementation of Ni FUSI into manufacturing for 45/32 nm CMOS
Shickova, Adelina; Kauerauf, Thomas; Rothschild, Aude; Aoulaiche, Marc; Sahhaf, Sahar; Kaczer, Ben; Veloso, Anabela; Torregiani, Cristina; Pantisano, Luigi; Lauwers, Anne; Zahid, Mohammed; Rost, Tim; Tigelaar, H.; Pas, M.; Fretwell, J.; McCormack, J.; Hoffmann, Thomas; Kerner, Christoph; Chiarella, Thomas; Brus, Stephan; Harada, Yoshinao; Niwa, Masaaki; Kaushik, Vidya; Maes, Herman; Absil, Philippe; Groeseneken, Guido; Biesemans, Serge; Kittl, Jorge (2007) -
Advanced modeling and parameter extraction of the MOSFET ESD breakdown triggering in the 90nm CMOS node technologies
Vassilev, Vesselin; Lorenzini, Martino; Jansen, Philippe; Groeseneken, Guido; Thijs, Steven; Mahadeva Iyer, Natarajan; Steyaert, M.; Maes, Herman (2004) -
An analytical model for the optimization of source-side injection flash EEPROM devices
Van Houdt, Jan; Groeseneken, Guido; Maes, Herman (1995) -
An easy-to-use mismatch model for the MOS transistor
Croon, Jeroen; Rosmeulen, Maarten; Decoutere, Stefaan; Sansen, Willy; Maes, Herman (2002) -
An inelastic quantum tunnelling model for current conduction after soft-breakdown
Nigam, Tanya; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.; Deferm, Ludo (1995) -
Analysis and improved compact modelling of the breakdown behaviour of sub-0.25 micron ESD protection ggNMOS devices
Vassilev, Vesselin; Lorenzini, Martino; Groeseneken, Guido; Steyaert, Michel; Maes, Herman (2001)