Browsing by author "Libezny, Milan"
Now showing items 21-26 of 26
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Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers
Libezny, Milan; Caymax, Matty; Brablec, A.; Kubena, J.; Holy, V.; Poortmans, Jef; Nijs, Johan; Vanhellemont, Jan (1994) -
Spectroscopic study of oxygen related lattice defects in annealed silicon
Vanhellemont, Jan; Libezny, Milan; Simoen, Eddy; Claeys, Cor; Clauws, P.; Blondeel, A. (1994) -
Spectroscopic study of oxygen related lattice defects in annealed silicon
Vanhellemont, Jan; Libezny, Milan; Simoen, Eddy; Claeys, C.; Clauws, P.; Blondeel, A. (1995) -
Structural and electrical characterization of FeSix-layers (1 < X < 2) prepared by RTA of Fe layers sputtered on Si (100)
Libezny, Milan; Poortmans, Jef; Amesz, Peter Henk; Alves Donaton, Ricardo; Larsen, Kim Kyllesbech; Vandenabeele, Peter; Jonckx, Franky; Maex, Karen; Nijs, Johan (1995) -
The Use of Complex Cubic Splines as a Powerful Mathematical Representation for (n,k) Reference Spectra in Spectroscopic Ellipsometry Applications
Roussel, Philippe; Libezny, Milan; Vanhellemont, Jan; Maes, Herman (1995) -
Thin film crystalline silicon solar cells
Libezny, Milan; Vermeulen, Tom; Evrard, Olivier; Poortmans, Jef; Nijs, Johan (1996)