Browsing by author "Maex, Karen"
Now showing items 21-40 of 643
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A physics-based VLSI interconnect model including substrate and conductor skin effects
Ymeri, H.; Nauwelaers, Bart; Maex, Karen; De Roest, David (2004) -
A quantitative adhesion study between contacting materials in Cu damascene structures
Lanckmans, Filip; Brongersma, Sywert; Varga, Istvan; Poortmans, Jef; Bender, Hugo; Conard, Thierry; Maex, Karen (2002) -
A quantitative study of the adhesion between copper, barrier and organic low-k polymers
Lanckmans, Filip; Brongersma, Sywert; Varga, Istvan; Beyne, Eric; Maex, Karen (2000) -
A quantitative study of the adhesion between copper, barrier and organic low-k polymers
Lanckmans, Filip; Brongersma, Sywert; Varga, Istvan; Bender, Hugo; Beyne, Eric; Maex, Karen (2001) -
A reliability study of titanium silicide lines using micro-raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A reliability study of titanium silicide lines using micro-Raman spectroscopy and electron microscopy
De Wolf, Ingrid; Howard, Dave; Rasras, Mahmoud; Lauwers, A.; Maex, Karen; Groeseneken, Guido; Maes, Herman (1997) -
A study of growth mechanism of TiN and WCN barrier films deposited by atomic layer deposition on different substrates
Satta, Alessandra; Schuhmacher, Jörg; Whelan, Caroline; Vandervorst, Wilfried; Brongersma, Sywert; Beyer, Gerald; Brijs, Bert; Conard, Thierry; Maex, Karen; Vantomme, Andre; Viitanen, M.M.; Brongersma, H.H. (2002) -
A study on (Co1-xNixSi2) Schottky contacts on N-Si(100) substrates
Qu, Xin-Ping; Detavernier, C.; Van Meirhaeghe, R.L.; Cardon, F.; Lauwers, Anne; Maex, Karen; Li, Bin-Zong (2001) -
A theoretical and experimental study of atomic-layer-deposited films onto porous dielectric substrates
Travaly, Youssef; Schuhmacher, Jorg; Baklanov, Mikhaïl; Giangrandi, Simone; Richard, Olivier; Brijs, Bert; Van Hove, Marleen; Maex, Karen; Abell, Thomas; Somers, K.R.F; Hendrickx, M.F.A; Vanquickenborne, L.G.; Ceulemans, A.; Jonas, A.M (2005-10) -
A thermal stability study of Alkane and aromatic thiolate self-assembled monolayers on copper surfaces
Carbonell, Laure; Whelan, Caroline; Kinsella, Michael; Maex, Karen (2004) -
A yield-aware modeling methodology for nano-scaled SRAM designs
Grossar, Evelyn; Croon, Jeroen; Stucchi, Michele; Dehaene, Wim; Maex, Karen (2005) -
Accurate analytic expressions for frequency-dependent inductance and resistance of single on-chip interconnects on conductive silicon Substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David; Vandenberghe, S. (2002) -
Accurate closed-form expression for the frequency- dependent mutual impedance of on-chip interconnects on lossy silicon substrate
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen (2001) -
Accurate frequency-dependent formula for series line impedance of microstrip on lossy silicon substrate
Ymeri, H.; Nauwelaers, Bart; Maex, Karen; De Roest, D. (2001) -
Add-on Cu/Silk (Tm) module for high Q inductors
Jenei, Snezana; Decoutere, Stefaan; Maex, Karen; Nauwelaers, Bart (2002) -
Adhesion study between materials for integration of copper and inorganic low-k dielectrics
Lanckmans, Filip; Brongersma, Sywert; Poortmans, Jef; Conard, Thierry; Bender, Hugo; Beyne, Eric; Maex, Karen (2001) -
Admittance matrix calculations of on-chip interconnects on lossy silicon substrate using multilayer Green's function
Ymeri, Hasan; Nauwelaers, Bart; Maex, Karen; De Roest, David; Vandenberghe, S.; Stucchi, Michele (2001) -
Advanced solutions for copper and low k technology
Beyer, Gerald; Baklanov, Mikhaïl; Brongersma, Sywert; De Roest, David; Donaton, R.; Grillaert, Joost; Lanckmans, Filip; Maenhoudt, Mireille; Maex, Karen; Richard, Emmanuel; Struyf, Herbert; Stucchi, Michele; Tokei, Zsolt; Van Hove, Marleen; Vervoort, Iwan (2000) -
Aggressive scaling of Cu lowk: impact on metrology
Maex, Karen; Brongersma, Sywert; Iacopi, Francesca; Vanstreels, Kris; Travaly, Youssef; Baklanov, Mikhaïl; D'Haen, Jan; Beyer, Gerald (2005) -
Al speed fill
Beyer, Gerald; Maex, Karen; Daniels, Stephen; Lee, S.; Proost, Joris; Bender, Hugo; Judelewicz, Moshe; Maity, Nirmalya (1999)