Browsing by author "Simoen, Eddy"
Now showing items 21-40 of 1574
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A deep-level transient spectroscopy study of silicon interface states using different silicon nitride surface passivation schemes
Gong, Chun; Simoen, Eddy; Posthuma, Niels; Van Kerschaver, Emmanuel; Poortmans, Jef; Mertens, Robert (2010) -
A deep-level transient spectroscopy study of silicon Schottky barriers containing a Si-O superlattice
Simoen, Eddy; Jayachandran, Suseendran; Delabie, Annelies; Caymax, Matty; Heyns, Marc (2017) -
A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies
Hsu, B.; Syshchyk, O.; Vais, Abhitosh; Yu, Hao; Alian, AliReza; Mols, Yves; Vondkar Kodandarama, Komal; Kunert, Bernardette; Waldron, Niamh; Simoen, Eddy; Collaert, Nadine (2021) -
A DLTS study of Pt/Al2O3/InxGa1-xAs capacitors
Simoen, Eddy; Brammertz, Guy; Penaud, Julien; Merckling, Clement; Lin, Dennis; Wang, Wei-E; Meuris, Marc (2009) -
A DLTS study of Pt/Al2O3/InxGa1-xAs capacitors
Simoen, Eddy; Brammertz, Guy; Penaud, Julien; Merckling, Clement; Lin, Dennis; Wang, Wei-E; Meuris, Marc (2009) -
A DLTS study of SiO2 and SiO2/SiNx bi-layer surface passivation of silicon
Simoen, Eddy; Gong, Chun; Posthuma, Niels; Van Kerschaver, Emmanuel; Poortmans, Jef; Mertens, Robert (2010) -
A DLTS study of SiO2 and SiO2/SiNx bi-layer surface passivation of silicon
Simoen, Eddy; Gong, Chun; Posthuma, Niels; Van Kerschaver, Emmanuel; Poortmans, Jef; Mertens, Robert (2010) -
A DLTS study of SiO2 and SiO2/SiNx surface passivation of silicon
Simoen, Eddy; Gong, Chun; Posthuma, Niels; Van Kerschaver, Emmanuel; Poortmans, Jef; Mertens, Robert (2011) -
A DLTS study on plasma-hydrogenated n-type high-resistivity MCz silicon
Huang, J.L.; Simoen, Eddy; Claeys, Cor; Rafi, J.M.; Clauws, P. (2007) -
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs
Zhou, Longda; Zhang, Zhaohao; Yang, Hong; Ji, Zhigang; Liu, Qianqian; Zhang, Qingzhu; Simoen, Eddy; Yin, Huaxiang; Luo, Jun; Du, Anyan; Zhao, Chao; Wang, Wenwu (2021) -
A global description of the base current 1/f noise of polysilicon emitter bipolar transistors before and after hot-carrier stress
Simoen, Eddy; Decoutere, Stefaan; Claeys, Cor; Deferm, Ludo (1998) -
A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Cretu, Bogdan; Simoen, Eddy; Routoure, Jean-Marc; Carin, Regis; Aoulaiche, Marc; Claeys, Cor (2013) -
A low temperature technology on the base of hydrogen enhanced thermal donor formation for future high voltage applications
Job, R.; Ulyashin, A.G.; Fahrner, W.R.; Niedernostheide, F.J.; Schulze, H. J.; Simoen, Eddy; Claeys, Cor; Tonelli, G. (2002) -
A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
Vasina, Petr; Sikula, J.; Simoen, Eddy; Claeys, C. (1995) -
A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs
Vasina, Petr; Simoen, Eddy; Claeys, Cor; Sikula, J. (1998) -
A low-frequency noise study of state-of-the-art silicon n+p junction diodes
Simoen, Eddy; Vanhellemont, Jan; Claeys, Cor; Bosman, Gijs (1995) -
A low-frequency noise study of the physical hot-carrier degradation mechanisms in lowly-doped-drain Si MOSFETs
Vasina, Petr; Simoen, Eddy; Sikula, J.; Claeys, Cor (1996) -
A model for MOS gate stack quality evaluation based on the gate current 1/f noise
Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008) -
A model for the radiation degradation of polycrystalline silicon films
Ohyama, H.; Nakabayashi, M.; Takakura, K.; Simoen, Eddy; Takami, Y.; Claeys, Cor (2002) -
A model of threading dislocation density in strain-relaxed Ge and GaAs epitaxial films on Si (100)
Wang, Gang; Loo, Roger; Simoen, Eddy; Souriau, Laurent; Caymax, Matty; Heyns, Marc; Blanpain, Bart (2009-03)