Browsing by author "Wu, Ming Fang"
Now showing items 21-40 of 45
-
Growth of high-quality buried Y- and (Y, Nd)-silicide layers prepared by channelled ion implantation
Jin, S.; Bender, Hugo; Wu, Ming Fang; Vantomme, Andre; Hogg, S.; Pattyn, H.; Langouche, G. (1998) -
High quality GdSi1.7 layers formed by high dose channeled implantation
Wu, Ming Fang; Vantomme, Andre; Pattyn, Hugo; Langouche, G.; Bender, Hugo (1996) -
HREM characterization of ion beam synthesized ternary silicides in (111) silicon
Tavares, J.; Bender, Hugo; Wu, Ming Fang; Vantomme, Andre; Langouche, G.; Lin, Chia-Hui (1995) -
Ion beam synthesis of buried CoxNi1-xSi2 layers in silicon
Wu, Ming Fang; De Wachter, Jo; Van Bavel, Mieke; Pattyn, H.; Langouche, G.; Vanhellemont, Jan; Bender, Hugo; Temst, K.; Bruynseraede, Y. (1994) -
Ion beam synthesis of buried CoxNi1-xSi2 layers in silicon
Wu, Ming Fang; De Wachter, Jo; Van Bavel, Mieke; Pattyn, H.; Langouche, G.; Vanhellemont, Jan; Bender, Hugo; Temst, K.; Wuyts, Bart; Bruynseraede, Y. (1994) -
Ion beam synthesis of heteroepitaxial erbium silicide layers
Wu, Ming Fang; Vantomme, Andre; Pattyn, H.; Langouche, G.; Bender, Hugo (1996) -
Ion beam synthesis of ternary phase CoFe-silicide in (111)Silicon
Tavares, J.; Bender, Hugo; Wu, Ming Fang; Vantomme, Andre; Langouche, G.; Lin, Chia-Hui (1995) -
Optical spectroscopy and composition of GaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. W. (2000) -
Optical spectroscopy and composition of InGaN
O'Donnell, K. P.; Martin, R. W.; White, M. E.; Jacobs, Koen; Van der Stricht, Wim; Demeester, Piet; Vantomme, Andre; Wu, Ming Fang; Mosselmans, J. F. (1999) -
Photoluminescence mapping and Rutherford backscattering of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen (1999) -
Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
O'Donnell, K. P.; White, M. E.; Pereira, S.; Wu, Ming Fang; Vantomme, Andre; Van der Stricht, Wim; Jacobs, Koen; Martin, R. W. (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; Treguer, J. F.; Grimson, S. T. F.; Osborne, I.; Barisonzi, M.; Middleton, P. G.; Manson-Smith, S. K.; Mohammed, A.; O'Donnell, K. P.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre (1999) -
Probing nitride thin films in 3-dimensions using a variable energy electron beam
Trager-Cowan, C.; McColl, D.; Sweeney, F.; Grimson, S. T. F.; Treguer, J. F.; Mohammed, A.; Middleton, P. G.; Manson-Smith, S. K.; O'Donnell, K. P.; Van der Stricht, Wim; Moerman, Ingrid; Demeester, Piet; Wu, Ming Fang; Vantomme, Andre; Zubia, D.; Hersee, S. D. (2000) -
Rutherford backscattering/channeling study of a thin AlGaN layer on Al2O03(0001)
Wu, Ming Fang; Vantomme, Andre; Hogg, S.; Langouche, G.; Van der Stricht, Wim; Jacobs, Koen; Moerman, Ingrid (2001) -
Stabilisation and phase transformation of hexagonal rare-earth silicides on Si(111)
Vantomme, Andre; Wu, Ming Fang; Hogg, S.; Wahl, U.; Deweerd, Wim; Pattyn, Hugo; Langouche, G.; Jin, S.; Bender, Hugo (1998) -
Stabilisation and phase transformation of hexagonal rare-earth silicides on Si(111)
Vantomme, Andre; Wu, Ming Fang; Hogg, S. M.; Wahl, U.; Deweerd, Wim; Pattyn, Hugo; Langouche, G.; Jin, S.; Bender, Hugo (1999) -
Structural characterization of ion beam synthesized epitaxial ErSi2-x layers
Bender, Hugo; Wu, Ming Fang; Vantomme, Andre; Pattyn, Hugo; Langouche, G. (1996) -
Structural characterization of ion-beam synthesized NiSi2 layers
Wu, Ming Fang; De Wachter, Jo; Van Bavel, Mieke; Moons, Raf; Vantomme, Andre; Pattyn, Hugo; Langouche, G.; Bender, Hugo; Vanhellemont, Jan; Temst, K.; Bruynseraede, Y. (1995)