Recently added

Track height reduction for standard-cell in below 5nm node: How low can you go?

Sherazi, Yasser; Chae, Jung Kyu; Debacker, Peter; Mattii, Luca; Raghavan, Praveen; Gerousis, V.; Verkest, Diederik; Mocuta, Anda; Kim, Ryan Ryoung han; Spessot, Alessio; Ryckaert, Julien (2018)

A particle swarm optimization-based heuristic for optimal cost estimation in Internet of Things

Sharif, Muddsair; Mercelis, Siegfried; Marquez-Barja, Johann; Hellinckx, Peter (2018)

IT in road construction : recommendations for the development of production, transport and paving data storage in the Flemish region

Sharif, Muddsair; Jacobs, Geert; Van den bergh, Wim; Hellinckx, Peter (2018)

45 Gb/s direct modulation of two-section InP-on-Si DFB laser diodes

Shahin, Mahmoud; Ma, K.; Abbasi, Amin; Roelkens, Gunther; Morthier, Geert (2018-04)

Bending impact on the performance of a flexible Li4Ti5O12-based all-solid-state thin-film battery

Sepulveda Marquez, Alfonso; Speulmanns, Jan; Vereecken, Philippe (2018)

How low can you go? Low densities of poly(ethyleneglycol) surfactants attract stealth proteins

Seneca, Senne; Simon, Johanna; Weber, Claudia; Ghazaryan, Arthur; Ethirajan, Anitha; Miilaender, Volker; Morsbach, Svenja; Landfester, Katharina (2018)

Metamaterial inspired miniaturized SIW resonator for sensor applications

Sen, Yan; Bao, Juncheng; Ocket, Ilja; Nauwelaers, Bart; Vandenbosch, Guy (2018)

Analysis of large-scale experimental data from wireless networks

Seidel, S.A.; Mehari, Michael; Colbourn, C.J.; De Poorter, Eli; Moerman, Ingrid; Syrotiuk, V.R. (2018-04)

Data harvesting, curation and fusion model to support public service recommendations for e-governments

Sedrakyan, Gayane; De Vocht, Laurens; Alonso, J.; Escalante, M.; Orue-Echevarria, L.; Mannens, Erik (2018-01)

Orchestrator conversation: distributed management of cloud applications

Sebrechts, Merlijn; Van Seghbroeck, Gregory; Wauters, Tim; Volckaert, Bruno; De Turck, Filip (2018-09)

Beyond generic lifecycles: Reusable modeling of custom-fit management workflows for cloud applications

Sebrechts, Merlijn; Johns, C.; Van Seghbroeck, Gregory; Wauters, Tim; Volckaert, Bruno; De Turck, Filip (2018)

Cleaning the high aspect ratio STI structures for advanced logic devices by implementation of a surface modification drying technique

Sebaai, Farid; Vereecke, Guy; Xu, XiuMei; Baudot, Sylvain; Amemiya, Fumihiro; Komori, Kana; Holsteyns, Frank (2018)

Temperature variation induced performance decline of perovskite solar cells

Schwenzer, Jonas; Rakocevic, Lucija; Gehlhaar, Robert; Abzieher, T.; Gharibzadeh, S.; Moghadamzadeh, S.; Quintilla, A.; Richards, B.; Lemmer, U.; Paetzold, Ulrich (2018)

Mobile exergaming in adolescents' everyday life : contextual design of where, when, with whom, and how : the SmartLife case

Schwarz, Ayla; DeSmet, Ann; Cardon, Greet; Chastin, Sebastien; Costa, Ruben; Grilo, Antonio; Ferri, Josue; Domenech, Jorge; Stragier, Jeroen (2018)

Impedimetric sensing of DNA with silicon nanowire transistors as alternative transducer principle

Schwartz, Miriam; Nguyen, Thanh Chien; Vu, Xuan Thang; Wagner, Patrick; Thoelen, Ronald; Ingebrandt, Sven (2018)

Detection of biomolecules using multivariant data analysis from silicon nanowire field-effect transistor arrays

Schwartz, Miriam (2018-04)

Non-destructive characterization of extended crystalline defects in confined semiconductor device structures

Schulze, Andreas; Strakos, Libor; Vystavel, Tomas; Loo, Roger; Pacco, Antoine; Collaert, Nadine; Vandervorst, Wilfried; Caymax, Matty (2018)

Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging

Schulze, Andreas; Han, Han; Strykos, Libor; Vystavel, Thomas; Porret, Clément; Loo, Roger; Caymax, Matty (2018)

Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling constrast imaging

Schulze, Andreas; Han, Han; Strakos, Libor; Vystavel, Tomas; Porret, Clément; Loo, Roger; Caymax, Matty (2018)

Sensitivity study of the parasitics of advanced finFETs

Schuddinck, Pieter; Iverson, Ralph; Annamalai, Senthil; Yakimets, Dmitry; Parvais, Bertrand; Sundaresan, Krishnakumar; Mocuta, Anda (2018)

imec Publications: Recent submissions

Track height reduction for standard-cell in below 5nm node: How low can you go? ﻿

A particle swarm optimization-based heuristic for optimal cost estimation in Internet of Things ﻿

IT in road construction : recommendations for the development of production, transport and paving data storage in the Flemish region ﻿

45 Gb/s direct modulation of two-section InP-on-Si DFB laser diodes ﻿

Bending impact on the performance of a flexible Li4Ti5O12-based all-solid-state thin-film battery ﻿

How low can you go? Low densities of poly(ethyleneglycol) surfactants attract stealth proteins ﻿

Metamaterial inspired miniaturized SIW resonator for sensor applications ﻿

Analysis of large-scale experimental data from wireless networks ﻿

Data harvesting, curation and fusion model to support public service recommendations for e-governments ﻿

Orchestrator conversation: distributed management of cloud applications ﻿

Beyond generic lifecycles: Reusable modeling of custom-fit management workflows for cloud applications ﻿

Cleaning the high aspect ratio STI structures for advanced logic devices by implementation of a surface modification drying technique ﻿

Temperature variation induced performance decline of perovskite solar cells ﻿

Mobile exergaming in adolescents' everyday life : contextual design of where, when, with whom, and how : the SmartLife case ﻿

Impedimetric sensing of DNA with silicon nanowire transistors as alternative transducer principle ﻿

Detection of biomolecules using multivariant data analysis from silicon nanowire field-effect transistor arrays ﻿

Non-destructive characterization of extended crystalline defects in confined semiconductor device structures ﻿

Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling contrast imaging ﻿

Ascertaining the nature and distribution of extended crystalline defects in emerging semiconductor materials using electron channeling constrast imaging ﻿

Sensitivity study of the parasitics of advanced finFETs ﻿