dc.contributor.author | Zhang, Cher Xuang | |
dc.contributor.author | Francis, Sarah Ashley | |
dc.contributor.author | Zhang, En Xia | |
dc.contributor.author | Fleetwood, Daniel M. | |
dc.contributor.author | Schrimpf, Ronald D. | |
dc.contributor.author | Galloway, Kenneth F. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-19T22:14:11Z | |
dc.date.available | 2021-10-19T22:14:11Z | |
dc.date.issued | 2011 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20197 | |
dc.source | IIOimport | |
dc.title | Effect of ionizing radiation on defects and 1/f noise in Ge pMOSFETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 764 | |
dc.source.endpage | 769 | |
dc.source.journal | IEEE Transactions on Nuclear Science | |
dc.source.issue | 3 | |
dc.source.volume | 58 | |
imec.availability | Published - open access | |
imec.internalnotes | Paper from RADECS 2010 | |