dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Boccardi, Guillaume | |
dc.contributor.author | Eneman, Geert | |
dc.contributor.author | Lin, Dennis | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Zhou, Daisy | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-22T18:43:58Z | |
dc.date.available | 2021-10-22T18:43:58Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25094 | |
dc.source | IIOimport | |
dc.title | Advanced channel materials for the semiconductor industry | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Boccardi, Guillaume | |
dc.contributor.imecauthor | Eneman, Geert | |
dc.contributor.imecauthor | Lin, Dennis | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Zhou, Daisy | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Boccardi, Guillaume::0000-0003-3226-4572 | |
dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 5 | |
dc.source.conference | IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - S3S | |
dc.source.conferencedate | 4/10/2015 | |
dc.source.conferencelocation | Rohnert Park, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7333542 | |
imec.availability | Published - open access | |