Browsing Conference contributions by author "Fantini, F."
Now showing items 1-3 of 3
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Hot electron degradation effects in Al0.25Ga0.75As/In0.2Ga0.8As/GaAs PHEMTs
Cova, P.; Menozzi, R.; Lacey, D.; Baeyens, Yves; Fantini, F. (1995) -
Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs
Menozzi, R; Borgarino, M.; Baeyens, Yves; Van Hove, Marleen; Fantini, F. (1996) -
The effect of passivation on the hot electron degradation of lattice-matched InAlAs/InGaAs/InP HEMTs
Menozzi, R.; Borgarino, M.; Baeyens, Yves; van der Zanden, Koen; Van Hove, Marleen; Fantini, F. (1997)