Browsing Conference contributions by author "Ablett, J.M."
Now showing items 1-2 of 2
-
HAXPES study of full high-k/metal gate stacks deposited on Ge substrates
Fleischmann, Claudia; Kalpyris, Ioannis; Conard, Thierry; Adelmann, Christoph; Sioncke, Sonja; Rueff, J.P.; Ablett, J.M.; Vandervorst, Wilfried (2013) -
Preliminary hard X-ray micro-spectroscopic investigations on thin-film Ta-and-W based diffusion barriers for copper interconnect technology
Ablett, J.M.; Woicik, J.C.; Tokei, Zsolt (2007)