Recently added

VLSI compatible SiON finFET sensors for biosensing applications: 2D/3D TCAD simulations and experimental verification of pH dependency

Santermans, Sybren; Martens, Koen; Hellings, Geert; Ruic, Dino; Gupta, Mihir; Van Roy, Wim; Du Bois, Bert; Severi, Simone; Heyns, Marc (2019)

Enhancing the ns-3 simulator by introducing Electric Vehicles features

Sanguesa, Julio; Salvatella, Samuel; Martinez, Francisco; Marquez-Barja, Johann; Ricardo, Manuel (2019)

Simulated grating-based x-ray phase contrast images of CFRP-like objects

Sanctorum, Jonathan; De Beenhouwer, Jan; Weissenbock, J.; Heinzl, C.; Kastner, J.; Sijbers, Jan (2019)

Towards bridging the gap between modern and legacy automotive ECUs: A Software-based Security Framework for Legacy ECUs

Samraj Thangarajan, Ashok; Ammar, Mahmoud; Crispo, Bruno; Hughes, Danny (2019)

Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation

Salahouelhadj, Abdellah; Gonzalez, Mario; Vanstreels, Kris; Podpod, Arnita; Phommahaxay, Alain; Rebibis, Kenneth June; Beyne, Eric (2019)

Scatterometry and AFM measurement combination for area selective deposition process characterization

Saib, Mohamed; Moussa, Alain; Charley, Anne-Laure; Leray, Philippe; Hung, Joey; Koret, Roy; Turovets, Igor; Ger, Avron; Deng, Shaoren; Illiberi, Andrea; Maes, Jan Willem; Woodworth, Gabriel; Strauss, Michael (2019)

Visual quality analysis of judder effect on head mounted displays

Saeed, Mahmoudpour; Schelkens, Peter (2019)

A power-efficient architecture for on-chip reservoir computing

Sackesyn, Stijn; Ma, Chonghuai; Katumba, Andrew; Dambre, Joni; Bienstman, Peter (2019)

Accurate online energy consumption estimation of IoT devices using Energest

Sabovic, Adnan; Delgado, Carmen; Bauwens, Jan; De Poorter, Eli; Famaey, Jeroen (2019)

A deep learning approach to T1 mapping in quantitative MRI

Sabidussi, E.; Nicastro, Michele; Bazrafkan, Shabab; Beirinckx, Quinten; Jeurissen, Ben; den dekker, Arnold Jan; Poot, D.H.J. (2019)

Enabling sub-5nm CMOS technology scaling thinner and taller!

Ryckaert, Julien; Na, Myung Hee; Weckx, Pieter; Jang, Doyoung; Schuddinck, Pieter; Chehab, Bilal; Patli, Sudhir; Sarkar, Satadru; Zografos, Odysseas; Baert, Rogier; Verkest, Diederik (2019)

Extending the roadmap beyond 3nm through system scaling boosters: A case study on buried power rail and backside power delivery

Ryckaert, Julien; Gupta, Anshul; Jourdain, Anne; Chava, Bharani; Van der Plas, Geert; Verkest, Diederik; Beyne, Eric (2019)

Conference contributions: Recent submissions

VLSI compatible SiON finFET sensors for biosensing applications: 2D/3D TCAD simulations and experimental verification of pH dependency

Enhancing the ns-3 simulator by introducing Electric Vehicles features

Simulated grating-based x-ray phase contrast images of CFRP-like objects

Towards bridging the gap between modern and legacy automotive ECUs: A Software-based Security Framework for Legacy ECUs

Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation

Scatterometry and AFM measurement combination for area selective deposition process characterization

Visual quality analysis of judder effect on head mounted displays

A power-efficient architecture for on-chip reservoir computing

Accurate online energy consumption estimation of IoT devices using Energest

A deep learning approach to T1 mapping in quantitative MRI

Enabling sub-5nm CMOS technology scaling thinner and taller!

Extending the roadmap beyond 3nm through system scaling boosters: A case study on buried power rail and backside power delivery

Derivative optical technologies: potential of integrated photonics beyond telecom

Characterization of highly doped Si:P, Si:As and Si:P:As Epi layers for source/drain epitaxy

Characterization of highly doped Si:P, Si:As and Si:P:As epi layers for source/drain epitaxy

EUVL is being inserted in HVM in 2019 : what are the mask related challenges remaining ?

Automated visual Inspection Algorithm for the Reflection Detection and Removing in Image Sequences

Integrated organic circuits based on industry-compatible process flows

Design, manufacturing and characterization of wearable textile nodes

Domain adaptive segmentation in volume electron microscopy imaging

Conference contributions: Recent submissions

VLSI compatible SiON finFET sensors for biosensing applications: 2D/3D TCAD simulations and experimental verification of pH dependency ﻿

Enhancing the ns-3 simulator by introducing Electric Vehicles features ﻿

Simulated grating-based x-ray phase contrast images of CFRP-like objects ﻿

Towards bridging the gap between modern and legacy automotive ECUs: A Software-based Security Framework for Legacy ECUs ﻿

Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation ﻿

Scatterometry and AFM measurement combination for area selective deposition process characterization ﻿

Visual quality analysis of judder effect on head mounted displays ﻿

A power-efficient architecture for on-chip reservoir computing ﻿

Accurate online energy consumption estimation of IoT devices using Energest ﻿

A deep learning approach to T1 mapping in quantitative MRI ﻿

Enabling sub-5nm CMOS technology scaling thinner and taller! ﻿

Extending the roadmap beyond 3nm through system scaling boosters: A case study on buried power rail and backside power delivery ﻿

Derivative optical technologies: potential of integrated photonics beyond telecom ﻿

Characterization of highly doped Si:P, Si:As and Si:P:As Epi layers for source/drain epitaxy ﻿

Characterization of highly doped Si:P, Si:As and Si:P:As epi layers for source/drain epitaxy ﻿

EUVL is being inserted in HVM in 2019 : what are the mask related challenges remaining ? ﻿

Automated visual Inspection Algorithm for the Reflection Detection and Removing in Image Sequences ﻿

Integrated organic circuits based on industry-compatible process flows ﻿

Design, manufacturing and characterization of wearable textile nodes ﻿

Domain adaptive segmentation in volume electron microscopy imaging ﻿

VLSI compatible SiON finFET sensors for biosensing applications: 2D/3D TCAD simulations and experimental verification of pH dependency

Enhancing the ns-3 simulator by introducing Electric Vehicles features

Simulated grating-based x-ray phase contrast images of CFRP-like objects

Towards bridging the gap between modern and legacy automotive ECUs: A Software-based Security Framework for Legacy ECUs

Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation

Scatterometry and AFM measurement combination for area selective deposition process characterization

Visual quality analysis of judder effect on head mounted displays

A power-efficient architecture for on-chip reservoir computing

Accurate online energy consumption estimation of IoT devices using Energest

A deep learning approach to T1 mapping in quantitative MRI

Enabling sub-5nm CMOS technology scaling thinner and taller!

Extending the roadmap beyond 3nm through system scaling boosters: A case study on buried power rail and backside power delivery

Derivative optical technologies: potential of integrated photonics beyond telecom

Characterization of highly doped Si:P, Si:As and Si:P:As Epi layers for source/drain epitaxy

Characterization of highly doped Si:P, Si:As and Si:P:As epi layers for source/drain epitaxy

EUVL is being inserted in HVM in 2019 : what are the mask related challenges remaining ?

Automated visual Inspection Algorithm for the Reflection Detection and Removing in Image Sequences

Integrated organic circuits based on industry-compatible process flows

Design, manufacturing and characterization of wearable textile nodes

Domain adaptive segmentation in volume electron microscopy imaging