Recently added

Composition analysis of III-V materials grown in nanostructures for semiconductor applications: the self focusing SIMS approach

Franquet, Alexis; Douhard, Bastien; Merckling, Clement; Conard, Thierry; Vandervorst, Wilfried (2015)

NBTI in Si0.55Ge0.45 cladding p-FinFETs: porting the superior reliability from planar to 3D architectures

Franco, Jacopo; Kaczer, Ben; Roussel, Philippe; Bury, Erik; Mertens, Hans; Ritzenthaler, Romain; Grasser, T.; Horiguchi, Naoto; Thean, Aaron; Groeseneken, Guido (2015)

Sputtering with large On+ cluster projectiles on inorganic surfaces

Fleischmann, Claudia; Conard, Thierry; Franquet, Alexis; Niehuis, Ewald; Rading, Derk; Moellers, Rudolf; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2015)

Micromechanical ring resonators with a 2D phononic crystal support for mechanical robustness and providing mask misalignment toelerance

Figeys, Bruno; Nauwelaers, Bart; Tilmans, Harrie; Rottenberg, Xavier (2015)

Study of broadband propagation characteristic of quasi-fractal phononic crystal for enhanced sensing applications

Figeys, Bruno; Jansen, Roelof; Severi, Simone; Nauwelaers, Bart; Tilmans, Harrie; Rottenberg, Xavier (2015)

Impact of device and interconnect process variability on clock distribution

Fievet, Nathalie; Raghavan, Praveen; Baert, Rogier; Robert, Frederic; Mercha, Abdelkarim; Verkest, Diederik; Thean, Aaron (2015)

Validation of improved compact model in grapho-epitaxy Directed-Self-Assembly (DSA)

Fenger, Germain; Bekaert, Joost; Torres, Andres; Granik, Yuri; Krasnova, Polina; Doise, Jan; Boeckx, Carolien; Vandenberghe, Geert; Gronheid, Roel (2015)

Intrinsic program instability in HfO2 RRAM and consequences on program algorithms

Fantini, Andrea; Gorine, Georgi; Degraeve, Robin; Goux, Ludovic; Chen, Michael; Redolfi, Augusto; Clima, Sergiu; Cabrini, Alessandro; Torelli, Guido; Jurczak, Gosia (2015)

Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack

Fang, Wen; Simoen, Eddy; Arimura, Hiroaki; Mitard, Jerome; Thean, Aaron; Luo, Jun; Zhao, Chao; Claeys, Cor (2015)

Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations

Fang, Chao; Vaglio Pret, Alessandro; Smith, Mark D.; Biafore, John J.; Robertson, Steward; Bekaert, Joost (2015)

Scalpel Soft Retrace Scanning Spreading Resistance microscopy for 3D-carrier profiling in sub 10-nm WFIN FinFETs

Eyben, Pierre; Chiarella, Thomas; Kubicek, Stefan; Bender, Hugo; Richard, Olivier; Mitard, Jerome; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron (2015)

FinFET stressor efficiency on alternative wafer and channel orientations for the14nm node and beyond

Eneman, Geert; De Keersgieter, An; Mocuta, Anda; Collaert, Nadine; Thean, Aaron (2015)

Plasma patterning of SIS modified DSA line space patterns into silicon

El Otell, Ziad; Singh, Arjun; Chan, BT; Gronheid, Roel; de Marneffe, Jean-Francois (2015)

Molecular glass resist performance for nano-pattern transfer

El Otell, Ziad; Ringk, Andreas; Kolb, Tristan; Neuber, Christian; Haensel, Leander; de Marneffe, Jean-Francois (2015-03)

Vacuum ultra-violet emission of plasmas and their effect on etched materials

El Otell, Ziad; de Marneffe, Jean-Francois (2015)

Structural and electrical investigations of III-(As,Sb) Esaki diodes for BTBT evaluation in TFET devices

El Kazzi, Salim; Smets, Quentin; Rooyackers, Rita; Geypen, Jef; Verhulst, Anne; Collaert, Nadine; Heyns, Marc; Merckling, Clement; Thean, Aaron (2015)

MBE growth investigations of InxGa1-xAs/GaAsySb1-y systems for TFET performance prediction

El Kazzi, Salim; Smets, Quentin; Rooyackers, Rita; Delmotte, Joris; Geypen, Jef; Verhulst, Anne; Collaert, Nadine; Heyns, Marc; Merckling, Clement; Thean, Aaron (2015)

Measurements of effective refractive index of SOI waveguides using interferometers

Dwivedi, Sarvagya Paavan; Van Vaerenbergh, Thomas; Ruocco, Alfonso; Spuesens, Thijs; Dumon, Pieter; Bogaerts, Wim (2015)

Coarse wavelength division multiplexer on silicon-on-insulator for 100 GbE

Dwivedi, Sarvagya Paavan; De Heyn, Peter; Absil, Philippe; Van Campenhout, Joris; Bogaerts, Wim (2015)

Comparison of electrical properties of thermo-compression bonded 3D stacks using a liquid and a dry-film wafer level underfills

Duval, Fabrice; Wang, Teng; Capuz, Giovanni; Gerets, Carine; Miller, Andy; Rebibis, Kenneth June; Beyne, Eric (2015)

Conference contributions: Recent submissions

Composition analysis of III-V materials grown in nanostructures for semiconductor applications: the self focusing SIMS approach ﻿

NBTI in Si0.55Ge0.45 cladding p-FinFETs: porting the superior reliability from planar to 3D architectures ﻿

Sputtering with large On+ cluster projectiles on inorganic surfaces ﻿

Micromechanical ring resonators with a 2D phononic crystal support for mechanical robustness and providing mask misalignment toelerance ﻿

Study of broadband propagation characteristic of quasi-fractal phononic crystal for enhanced sensing applications ﻿

Impact of device and interconnect process variability on clock distribution ﻿

Validation of improved compact model in grapho-epitaxy Directed-Self-Assembly (DSA) ﻿

Intrinsic program instability in HfO2 RRAM and consequences on program algorithms ﻿

Low-frequency noise study of Ge pMOSFETs with HfO2/Al2O3/GeOx gate stack ﻿

Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations ﻿

Scalpel Soft Retrace Scanning Spreading Resistance microscopy for 3D-carrier profiling in sub 10-nm WFIN FinFETs ﻿

FinFET stressor efficiency on alternative wafer and channel orientations for the14nm node and beyond ﻿

Plasma patterning of SIS modified DSA line space patterns into silicon ﻿

Molecular glass resist performance for nano-pattern transfer ﻿

Vacuum ultra-violet emission of plasmas and their effect on etched materials ﻿

Structural and electrical investigations of III-(As,Sb) Esaki diodes for BTBT evaluation in TFET devices ﻿

MBE growth investigations of InxGa1-xAs/GaAsySb1-y systems for TFET performance prediction ﻿

Measurements of effective refractive index of SOI waveguides using interferometers ﻿

Coarse wavelength division multiplexer on silicon-on-insulator for 100 GbE ﻿

Comparison of electrical properties of thermo-compression bonded 3D stacks using a liquid and a dry-film wafer level underfills ﻿