Recently added

Intrinisic reliability of local interconnects for N7 and beyond

Croes, Kristof; Lesniewska, Alicja; Wu, Chen; Ciofi, Ivan; Banczerowska, Aga; Briggs, Basoene; Demuynck, Steven; Tokei, Zsolt; Boemmels, Juergen; Saad, Y.; Gao, Weimin (2015)

Impact of process variability on BEOL TDDB lifetime model assessment

Croes, Kristof; Kocaay, Deniz; Ciofi, Ivan; Boemmels, Juergen; Tokei, Zsolt (2015)

Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs

Cretu, Bogdan; Simoen, Eddy; Routoure, Jean-Marc; Carin, Regis; Aoulaiche, Marc; Claeys, Cor (2015)

Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs

Cretu, B.; Simoen, Eddy; Routoure, J.M.; Carin, R.; Aoulaiche, Marc; Claeys, Cor (2015)

Scale, hyperscale and metascalar information in living systems

Cottam, Ron; Ranson, Willy; Vounckx, Roger (2015)

The metascalar nature of information

Cottam, Ron; Ranson, Willy; Vounckx, Roger (2015)

In vivo synthesis of click functionalized nanobodies for advanced biosensing platforms

Cortens, David; Steen Redeker, Erik; Adriaensens, Peter; Guedens, Wanda (2015)

High quality profiles for inorganic material using Arn+ clusters: a must for hybrid system profiling and how to achieve them

Conard, Thierry; Fleischmann, Claudia; Havelund, Rasmus; Franquet, Alexis; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2015)

Advanced channel materials for the semiconductor industry

Collaert, Nadine; Alian, AliReza; Arimura, Hiroaki; Boccardi, Guillaume; Eneman, Geert; Lin, Dennis; Mitard, Jerome; Sioncke, Sonja; Waldron, Niamh; Witters, Liesbeth; Zhou, Daisy; Thean, Aaron (2015)

Designing the ideal transition-metal-oxide-based RRAM stack from first-principles thermodynamics and defect kinetics

Clima, Sergiu; Chen, Yangyin; Fantini, Andrea; Chen, Michael; Goux, Ludovic; Govoreanu, Bogdan; Degraeve, Robin; Jurczak, Gosia; Pourtois, Geoffrey (2015)

Coherent anti-Stokes Raman spectroscopy on chip

Clemmen, Stephane; Zhao, Haolan; Peyskens, Frederic; Dhakal, Ashim; Wuytens, Pieter; Subramanian, Ananth; Le Thomas, Nicolas; Baets, Roel (2015)

The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices

Claeys, Cor; Simoen, Eddy; Agopian, Paula; Martino, J.A.; Aoulaiche, Marc; Cretu, Bogdan; Vandooren, Anne; Rooyackers, Rita; Veloso, Anabela; Jurczak, Gosia; Collaert, Nadine; Thean, Aaron (2015)

Advanced semiconductor devices for future CMOS technologies

Claeys, Cor; Chiappe, Daniele; Collaert, Nadine; Mitard, Jerome; Radu, Iuliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron (2015)

Investigations of capacitively-coupled plasmas by electrostatic probe technique

Cirino, Giuseppe; Castro, Raul; Pisani, Marcelo; Verdonck, Patrick; Mansano, Ronaldo; Massi, Marcos; Pessoa, Rodrigo; Barea, Luis; Brahim, Tayeb; Maciel, Homero (2015)

Demonstration of an optical event horizon in a silicon nanophotonic waveguide

Ciret, C.; Leo, Francois; Kuyken, Bart; Roelkens, Gunther; Gorza, S.P. (2015)

Influence of porosity on VUV induced damage to low-k dielectrics

Choudhury, F.; de Marneffe, Jean-Francois; Baklanov, Mikhaïl; King, S.; Nishi, Y.; Shohet, J. (2015)

Off-state stress degradation mechanism on advanced p-MOSFETs

Cho, Moon Ju; Spessot, Alessio; Kaczer, Ben; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre; Horiguchi, Naoto; Linten, Dimitri (2015-06)

On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires

Cho, Moon Ju; Hellings, Geert; Veloso, Anabela; Simoen, Eddy; Roussel, Philippe; Kaczer, Ben; Arimura, Hiroaki; Fang, W; Franco, Jacopo; Matagne, Philippe; Collaert, Nadine; Linten, Dimitri; Thean, Aaron (2015)

Gaussian process regression for CSI and feedback estimation in LTE

Chiumento, Alessandro; Bennis, Mehdi; Desset, Claude; Bourdoux, André; Van der Perre, Liesbet; Pollin, Sofie (2015)

Effects of packaging on mechanical stress in 3D-ICs

Cherman, Vladimir; Lofrano, Melina; Simons, Veerle; Gonzalez, Mario; Van der Plas, Geert; De Vos, Joeri; Wang, Teng; Daily, Robert; Salahouelhadj, Abdellah; Beyer, Gerald; La Manna, Antonio; De Wolf, Ingrid; Beyne, Eric (2015)

Conference contributions: Recent submissions

Intrinisic reliability of local interconnects for N7 and beyond ﻿

Impact of process variability on BEOL TDDB lifetime model assessment ﻿

Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs ﻿

Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs ﻿

Scale, hyperscale and metascalar information in living systems ﻿

The metascalar nature of information ﻿

In vivo synthesis of click functionalized nanobodies for advanced biosensing platforms ﻿

High quality profiles for inorganic material using Arn+ clusters: a must for hybrid system profiling and how to achieve them ﻿

Advanced channel materials for the semiconductor industry ﻿

Designing the ideal transition-metal-oxide-based RRAM stack from first-principles thermodynamics and defect kinetics ﻿

Coherent anti-Stokes Raman spectroscopy on chip ﻿

The smaller the noisier? Low frequency noise diagnostics of advanced semiconductor devices ﻿

Advanced semiconductor devices for future CMOS technologies ﻿

Investigations of capacitively-coupled plasmas by electrostatic probe technique ﻿

Demonstration of an optical event horizon in a silicon nanophotonic waveguide ﻿

Influence of porosity on VUV induced damage to low-k dielectrics ﻿

Off-state stress degradation mechanism on advanced p-MOSFETs ﻿

On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires ﻿

Gaussian process regression for CSI and feedback estimation in LTE ﻿

Effects of packaging on mechanical stress in 3D-ICs ﻿