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Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
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Authors
Gao, Zhan
;
Hu, Min-Chun
;
Baert, Rogier
;
Chehab, Bilal
;
Swenton, Joe
;
Malagi, Santosh
;
Huisken, Jos
;
Goossens, Kees
;
Marinissen, Erik Jan
DOI
10.1109/MDAT.2023.3294872
ISSN
2168-2356
Issue
2
Journal
IEEE DESIGN & TEST
Volume
41
Title
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
Publication type
Journal article
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Summary
2
20.500.12860/43701.2
*
2024-08-06T09:55:15Z
validation by library/open access desk
1
20.500.12860/43701
2024-03-18T18:17:33Z
*Selected version
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