Show simple item record

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications

dc.contributor.authorSerbulova, Kateryna
dc.contributor.authorQiu, Zi-En
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorGrill, Alexander
dc.contributor.authorKao, Kuo-Hsing
dc.contributor.authorDe Boeck, Jo
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2024-09-19T14:46:41Z
dc.date.available2024-08-16T18:28:03Z
dc.date.available2024-09-19T14:46:41Z
dc.date.issued2024
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.otherWOS:001229691100066
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44311.2
dc.sourceWOS
dc.titleInsight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications
dc.typeProceedings paper
dc.contributor.imecauthorSerbulova, Kateryna
dc.contributor.imecauthorQiu, Zi-En
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorDe Boeck, Jo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecSerbulova, Kateryna::0000-0001-7326-9949
dc.contributor.orcidimecChen, Shih-Hung::0000-0002-6481-2951
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecDe Boeck, Jo::0000-0001-8244-1552
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.identifier.doi10.1109/IRPS48228.2024.10529388
dc.identifier.eisbn979-8-3503-6976-2
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedateAPR 14-18, 2024
dc.source.conferencelocationGrapevine
dc.source.journalN/A
imec.availabilityPublished - imec
dc.description.wosFundingTextThis work was supported in part by imec's Industrial Affiliation Program on Quantum Computing and Cryoelectronics.


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record

Version history

VersionItemDateSummary
220.500.12860/44311.2*2024-09-19T14:45:51Zvalidation by library/open access desk
120.500.12860/443112024-08-16T18:28:03Z

*Selected version