Browsing Articles by imec author "ea6a823b7c8733937f0119876fa333f59455f3f8"
Now showing items 1-20 of 66
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A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination
Trojman, Lionel; Acurio, Eliana; De Jaeger, Brice; Posthuma, Niels; Decoutere, Stefaan; Bakeroot, Benoit (2023) -
AlGaN/GaN/AlGaN double heterostructures grown on 200 mm silicon(111) substrates with high electron mobility
Cheng, Kai; Liang, Hu; Van Hove, Marleen; Geens, Karen; De Jaeger, Brice; Srivastava, Puneet; Kang, Xuanwu; Favia, Paola; Bender, Hugo; Decoutere, Stefaan; Dekoster, Johan; del Agua Borniquel, Jose Ignacio; Jun, Sung Won; Chung, Hua (2012) -
Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Bargallo Gonzalez, Mireia; Eneman, Geert; Wang, Gang; De Jaeger, Brice; Simoen, Eddy; Claeys, Cor (2011) -
Applicability of charge pumping on Germanium MOSFETs
Martens, Koen; Kaczer, Ben; Grasser, Tibor; De Jaeger, Brice; Meuris, Marc; Maes, Herman; Groeseneken, Guido (2008) -
Au-free AlGaN/GaN power diode on 8 in Si substrate with gated edge termination
Lenci, Silvia; De Jaeger, Brice; Carbonell, Laure; Hu, Jie; Mannaert, Geert; Wellekens, Dirk; You, Shuzhen; Bakeroot, Benoit; Decoutere, Stefaan (2013) -
Au-free ohmic contacts for AlGaN/GaN power devices on 200 mm Si substrates
Firrincieli, Andrea; De Jaeger, Brice; You, Shuzhen; Wellekens, Dirk; Van Hove, Marleen; Decoutere, Stefaan (2014) -
Challenges and opportunities in advanced Ge pMOSFETs
Simoen, Eddy; Mitard, Jerome; Hellings, Geert; Eneman, Geert; De Jaeger, Brice; Witters, Liesbeth; Vincent, Benjamin; Loo, Roger; Delabie, Annelies; Sioncke, Sonja; Caymax, Matty; Claeys, Cor (2012) -
Combined plasma-enhanced-atomic-layer-deposition gate dielectric and in situ SiN cap layer for reduced threshold voltage shift and dynamic ON-resistance dispersion of AlGaN
Ronchi, Nicolo; De Jaeger, Brice; Van Hove, Marleen; Roelofs, Robin; Wu, Tian-Li; Hu, Jie; Kang, Xuanwu; Decoutere, Stefaan (2015) -
Comparison of AlGaN/GaN MISHEMT powerbar designs
Stoffels, Steve; Ronchi, Nicolo; Venegas, Rafael; De Jaeger, Brice; Marcon, Denis; Decoutere, Stefaan (2014-02) -
Contact resistivity and Fermi-level pinning in n-type Ge contacts with epitaxial Si-passivation
Martens, Koen; Rooyackers, Rita; Firrincieli, Andrea; Vincent, Benjamin; Loo, Roger; De Jaeger, Brice; Meuris, Marc; Favia, Paola; Bender, Hugo; Douhard, Bastien; Vandervorst, Wilfried; Simoen, Eddy; Jurczak, Gosia; Wouters, Dirk; Kittl, Jorge (2011) -
Correlation of interface states/border traps and threshold voltage shift on AlGaN/GaN metal-insulator-semiconductor high-electron-mobility transistors
Wu, Tian-Li; Marcon, Denis; Bakeroot, Benoit; De Jaeger, Brice; Lin, Dennis; Franco, Jacopo; Stoffels, Steve; Van Hove, Marleen; Groeseneken, Guido; Decoutere, Stefaan (2015) -
Defect assessment and leakage control in Ge junctions
Gonzalez, M.B.; Simoen, Eddy; Eneman, Geert; De Jaeger, Brice; Wang, G.; Loo, Roger; Claeys, Cor (2014) -
Defect Characterization in High-Electron-Mobility Transistors with Regrown p-GaN Gate by Low-Frequency Noise and Deep-Level Transient Spectroscopy
Hsu, Po-Chun; Simoen, Eddy; Liang, Hu; De Jaeger, Brice; Bakeroot, Benoit; Wellekens, Dirk; Decoutere, Stefaan (2021) -
Defect-related excess low-frequency noise in Ge-on-Si pMOSFETs
Simoen, Eddy; Mitard, Jerome; De Jaeger, Brice; Eneman, Geert; Dobbie, A.; Myronov, M.; Leadley, D.R.; Meuris, Marc; Hoffmann, Thomas Y.; Claeys, Cor (2011) -
Deposition of HfO2 on germanium and the impact of surface pretreatments
Van Elshocht, Sven; Brijs, Bert; Caymax, Matty; Conard, Thierry; Chiarella, Thomas; De Gendt, Stefan; De Jaeger, Brice; Kubicek, Stefan; Meuris, Marc; Onsia, Bart; Richard, Olivier; Teerlinck, Ivo; Van Steenbergen, Jan; Zhao, Chao; Heyns, Marc (2004) -
Device assessment of the electrical activity of threading dislocations in strained Ge epitaxial layers
Simoen, Eddy; Brouwers, Gijs; Eneman, Geert; Bargallo Gonzalez, Mireia; De Jaeger, Brice; Mitard, Jerome; Brunco, David; Souriau, Laurent; Cody, N.; Thomas, S.; Meuris, Marc (2008) -
Diffusion, activation and recrystallization of boron implanted in preamorphized and crystalline germanium
Satta, Alessandra; Simoen, Eddy; Clarysse, Trudo; Janssens, Tom; Benedetti, Alessandro; De Jaeger, Brice; Meuris, Marc; Vandervorst, Wilfried (2005) -
Electrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation
Kaczer, Ben; De Jaeger, Brice; Nicholas, Gareth; Martens, Koen; Degraeve, Robin; Houssa, Michel; Pourtois, Geoffrey; Leys, Frederik; Meuris, Marc; Groeseneken, Guido (2007) -
Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacks
Houssa, Michel; De Jaeger, Brice; Delabie, Annelies; Van Elshocht, Sven; Afanasiev, Valeri; Autran, J.L.; Stesmans, Andre; Meuris, Marc; Heyns, Marc (2005) -
Electrical TCAD simulation of a germanium pMOSFET technology
Hellings, Geert; Eneman, Geert; Krom, Raymond; De Jaeger, Brice; Mitard, Jerome; De Keersgieter, An; Hoffmann, Thomas Y.; Meuris, Marc; De Meyer, Kristin (2010)