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How reliable are reliability tests?

dc.contributor.authorTielemans, L.
dc.contributor.authorRongen, R.
dc.contributor.authorDe Ceuninck, Ward
dc.date.accessioned2021-10-14T23:21:56Z
dc.date.available2021-10-14T23:21:56Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6881
dc.sourceIIOimport
dc.titleHow reliable are reliability tests?
dc.typeJournal article
dc.contributor.imecauthorDe Ceuninck, Ward
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1339
dc.source.endpage1345
dc.source.journalMicroelectronics Reliability
dc.source.issue9_11
dc.source.volume42
imec.availabilityPublished - open access
imec.internalnotes13th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF; October 2002; Rimini, Italy


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