Silva, V. C. P.V. C. P.SilvaMartino, J. A.J. A.MartinoSimoen, EddyEddySimoenVeloso, AnabelaAnabelaVelosoAgopian, P. G. D.P. G. D.Agopian2024-04-102023-10-152024-04-1020230038-1101WOS:001071308100001https://imec-publications.be/handle/20.500.12860/42758Evaluation of n-type gate-all-around vertically-stacked nanosheet FETs from 473 K down to 173 K for analog applicationsJournal article10.1016/j.sse.2023.108729WOS:001071308100001FREQUENCYFIGURESMERIT