Spectroscopy of defects in epitaxially grown para-sexiphenyl nanostructures

Kadashchuk, AndriyAndriyKadashchukSchols, SarahSarahScholsSkryshevski, YuYuSkryshevskiBeynik, I.I.BeynikTeichert, C.C.TeichertHernandez-Sosa, G.G.Hernandez-SosaSitter, H.H.SitterAndreev, A.A.AndreevFrank, P.P.FrankWinkler, A.A.Winkler2021-10-172021-10-172009https://imec-publications.be/handle/20.500.12860/15565Spectroscopy of defects in epitaxially grown para-sexiphenyl nanostructuresProceedings paperin Interface Controlled Organic Thin Films, (Eds). H.-G. Rubahn, H. Sitter, G. Horowitz, K. Al-Shamery, (Springer GmbH , Vol. XI