Melange, CedricCedricMelangeBauwelinck, JohanJohanBauwelinckPletinckx, J.J.PletinckxVandewege, JanJanVandewege2021-10-162021-10-162005-12https://imec-publications.be/handle/20.500.12860/10879Low-cost BER tester measures errors in low-data-rate applicationsJournal article