Wu, ZhichengZhichengWuFranco, JacopoJacopoFrancoTruijen, BrechtBrechtTruijenRoussel, PhilippePhilippeRousselTyaginov, StanislavStanislavTyaginovVandemaele, MichielMichielVandemaeleBury, ErikErikBuryGroeseneken, GuidoGuidoGroesenekenLinten, DimitriDimitriLintenKaczer, BenBenKaczer2022-03-112022-03-1120211541-7026WOS:000672563100018https://imec-publications.be/handle/20.500.12860/39419Physics-based device aging modelling framework for accurate circuit reliability assessmentProceedings paper10.1109/IRPS46558.2021.9405106978-1-7281-6893-7WOS:000672563100018HOT-CARRIERDEGRADATION