Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design

Papanikolaou, AntonisAntonisPapanikolaouWang, HuaHuaWangMiranda Corbalan, MiguelMiguelMiranda CorbalanCatthoor, FranckyFranckyCatthoorDehaene, WimWimDehaene2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14270Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system designBook chapter