Radiation source dependence of degradation in MOSFETs on SIMOX substrate

Ohyama, HidenoriHidenoriOhyamaHakata, T.T.HakataSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami, Y.Y.TakamiKawamura, K.K.KawamuraMiyahara, K.K.MiyaharaHosashima, M.M.Hosashima2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2821Radiation source dependence of degradation in MOSFETs on SIMOX substrateProceedings paper