Fatermans, J.J.Fatermansden Dekker, A. J.A. J.den DekkerMueller-Caspary, K.K.Mueller-CasparyGauquelin, N.N.GauquelinVerbeeck, J.J.VerbeeckVan Aert, S.S.Van Aert2021-12-062021-11-022021-12-0620200304-3991WOS:000594768500005https://imec-publications.be/handle/20.500.12860/38336Atom column detection from simultaneously acquired ABF and ADF STEM imagesJournal article10.1016/j.ultramic.2020.113046WOS:000594768500005TRANSMISSION ELECTRON-MICROSCOPYMAXIMUM-LIKELIHOOD-ESTIMATIONSTRUCTURE PARAMETERSPHASE-CONTRASTSAMPLE TILTRESOLUTIONQUANTIFICATIONACCURATEMEDLINE:32927326