Poliakov, PavelPavelPoliakovBlomme, PieterPieterBlommeVaglio Pret, AlessandroAlessandroVaglio PretMiranda Corbalan, MiguelMiguelMiranda CorbalanGronheid, RoelRoelGronheidVerkest, DiederikDiederikVerkestVan Houdt, JanJanVan HoudtDehaene, WimWimDehaene2021-10-202021-10-2020120026-2714https://imec-publications.be/handle/20.500.12860/21318Trades-off between line edge roughness and error-correcting codes requirements for NAND Flash MemoriesJournal article