Vandersteen, GerdGerdVandersteenRolain, Y.Y.RolainSchoukens, J.J.Schoukens2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5776An identification technique for data acquisition characterization in the presence of nonlinear distortions and time base distortionsJournal article