Study of DID/ID of a single charge trap in UTBOX silicon films

Fang, WenWenFangSimoen, EddyEddySimoenAoulaiche, MarcMarcAoulaicheLuo, JunJunLuoZhao, ChaoChaoZhaoClaeys, CorCorClaeys2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23805Study of DID/ID of a single charge trap in UTBOX silicon filmsProceedings paper