First order and low-frequency noise study of 0.35µm polysilicon bipolar transistor

Jarrix, S. G.S. G.JarrixDelseny, C.C.DelsenyPenarier, A.A.PenarierPascal, F.F.PascalSimoen, EddyEddySimoenDecoutere, StefaanStefaanDecoutere2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3536First order and low-frequency noise study of 0.35µm polysilicon bipolar transistor - Influence of RTS noiseProceedings paper