Degradation behaviors for high temperature irradiated NPN Si transistors

Ohyama, H.H.OhyamaTakakura, K.K.TakakuraNishiyama, K.K.NishiyamaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6661Degradation behaviors for high temperature irradiated NPN Si transistorsProceedings paper