Aoulaiche, MarcMarcAoulaicheKaczer, BenBenKaczerDe Jaeger, BriceBriceDe JaegerHoussa, MichelMichelHoussaMartens, KoenKoenMartensDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselMitard, JeromeJeromeMitardDe Gendt, StefanStefanDe GendtMaes, HermanHermanMaesGroeseneken, GuidoGuidoGroesenekenMeuris, MarcMarcMeurisHeyns, MarcMarcHeyns2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/13307Negative bias temperature instability on Si-passivated Ge-interfaceProceedings paper