Neyts, K.K.NeytsDe Visschere, PatrickPatrickDe VisschereSoenen, B.B.SoenenStuyven, G.G.Stuyven2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4615Electrical modeling of interface roughness in thin film electroluminescent devicesJournal article