Fleischmann, ClaudiaClaudiaFleischmannHoenicke, PhilippPhilippHoenickeMueller, MatthiasMatthiasMuellerBeckhoff, BurkhardBurkhardBeckhoffVoroshazi, EszterEszterVoroshaziTait, JeffreyJeffreyTaitConard, ThierryThierryConardVandervorst, WilfriedWilfriedVandervorst2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23823Soft x-ray spectroscopy reveals chemical information beneath the surface of organic photovoltaic devicesOral presentation