Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniques

Asanovski, RubenRubenAsanovskiFranco, JacopoJacopoFrancoPalestri, PierpaoloPierpaoloPalestriKaczer, BenBenKaczerSelmi, LucaLucaSelmi2024-03-192023-10-052024-03-1920230038-1101WOS:001071171700001https://imec-publications.be/handle/20.500.12860/42651Investigating the correlation between interface and dielectric trap densities in aged p-MOSFETs using current-voltage, charge pumping, and 1/f noise characterization techniquesJournal article10.1016/j.sse.2023.108722WOS:001071171700001RANDOM TELEGRAPH NOISEFLICKER NOISEGATE