Subhechha, SubhaliSubhaliSubhechhaDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselGoux, LudovicLudovicGouxClima, SergiuSergiuClimaDe Meyer, KristinKristinDe MeyerVan Houdt, JanJanVan HoudtKar, Gouri SankarGouri SankarKar2021-10-262021-10-2620180741-3106https://imec-publications.be/handle/20.500.12860/31879Regular and inverted operating regimes in TiN/a-Si/TiOx/TiN RRAM devicesJournal articlehttps://ieeexplore.ieee.org/document/8274938/