Cingu, DeepthiDeepthiCinguLi, XiangdongXiangdongLiBakeroot, BenoitBenoitBakerootAmirifar, NooshinNooshinAmirifarGeens, KarenKarenGeensJacobs, Kristof J.P.Kristof J.P.JacobsZhao, MingMingZhaoYou, ShuzhenShuzhenYouGroeseneken, GuidoGuidoGroesenekenDecoutere, StefaanStefaanDecoutere2022-02-222022-02-2220210018-9383WOS:000612147300031https://imec-publications.be/handle/20.500.12860/38988Reliability of p-GaN Gate HEMTs in Reverse ConductionJournal article10.1109/TED.2020.3042134WOS:000612147300031DYNAMIC R-ONV-THSUPPRESSION