Ohyama, HidenoriHidenoriOhyamaHakata, T.T.HakataSimoen, EddyEddySimoenClaeys, C.C.ClaeysSunaga, H.H.SunagaHososhima, M.M.Hososhima2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2819Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particlesProceedings paper