On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective

Tyaginov, StanislavStanislavTyaginovBury, ErikErikBuryGrill, AlexanderAlexanderGrillYu, Z.Z.YuMakarov, AlexanderAlexanderMakarovDe Keersgieter, AnAnDe KeersgieterVexler, M. I.M. I.VexlerVandemaele, MichielMichielVandemaeleWang, R.R.WangSpessot, AlessioAlessioSpessotVaisman Chasin, AdrianAdrianVaisman ChasinKaczer, BenBenKaczer2024-05-232023-09-032024-05-232023N/AWOS:001004185500179https://imec-publications.be/handle/20.500.12860/42459On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling PerspectiveProceedings paper10.1109/EDTM55494.2023.10103111979-8-3503-3252-0WOS:001004185500179INTERFACEPASSIVATIONHYDROGEN