Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurations

Laskar, Md Ashiqur RahmanMd Ashiqur RahmanLaskarChakrabarti, SrijanSrijanChakrabartiAhmed, SakibSakibAhmedGhoreishi, S. AmirS. AmirGhoreishiTummala, PinakapaniPinakapaniTummalaAfanas'ev, ValeriValeriAfanas'evMolle, AlessandroAlessandroMolleLamperti, AlessioAlessioLampertiCelano, UmbertoUmbertoCelano2025-01-262025-01-262025-MAR 11369-8001WOS:001399946900001https://imec-publications.be/handle/20.500.12860/45113Optimizing electrical AFM probing for 2D materials: The crucial role of tip-sample electrical interactions and back contact configurationsJournal article10.1016/j.mssp.2024.109247WOS:001399946900001ATOMIC-FORCE MICROSCOPYMOS2