Relaxing the STT-MRAM reliability challenge by scaling MgO thickness

O'Sullivan, BarryBarryO'SullivanVan Beek, SimonSimonVan BeekRoussel, PhilippePhilippeRousselRao, SiddharthSiddharthRaoKim, WoojinWoojinKimCouet, SebastienSebastienCouetSwerts, JohanJohanSwertsYasin, FarrukhFarrukhYasinCrotti, DavideDavideCrottiLinten, DimitriDimitriLintenKar, Gouri SankarGouri SankarKar2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31461Relaxing the STT-MRAM reliability challenge by scaling MgO thicknessOral presentationhttps://irps.org/2018/program/poster-session-reception/