Idemoto, T.T.IdemotoOhyama, H.H.OhyamaTakakura, K.K.TakakuraTsunoda, I.I.TsunodaYoneoka, M.M.YoneokaNakashima, T.T.NakashimaBargallo Gonzalez, MireiaMireiaBargallo GonzalezSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17302Carrier lifetime evaluation of electron irradiated SiGe/Si diodeProceedings paper