Bargallo Gonzalez, MireiaMireiaBargallo GonzalezSimoen, EddyEddySimoenVissouvanadin Soubaretty, BertrandBertrandVissouvanadin SoubarettyEneman, GeertGeertEnemanVerheyen, PeterPeterVerheyenLoo, RogerRogerLooClaeys, CorCorClaeys2021-10-172021-10-1720090003-6951https://imec-publications.be/handle/20.500.12860/14947Electric field dependence of trap-assisted-tunneling current in strained SiGe source/drain junctionsJournal article