Ohyama, HidenoriHidenoriOhyamaHayama, KiyoteruKiyoteruHayamaMiura, T.T.MiuraSimoen, EddyEddySimoenClaeys, CorCorClaeysPoyai, AmpornAmpornPoyaiNakabayashi, M.M.NakabayashiKobayashi, K.K.Kobayashi2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6664Defect assessment of irradiated STI DiodesJournal article