Understanding and modelling the PBTI reliability of thin-film IGZO transistors

Vaisman Chasin, AdrianAdrianVaisman ChasinFranco, JacopoJacopoFrancoTriantopoulos, KonstantinosKonstantinosTriantopoulosDekkers, HaroldHaroldDekkersRassoul, NouredineNouredineRassoulBelmonte, AttilioAttilioBelmonteSmets, QuentinQuentinSmetsSubhechha, SubhaliSubhaliSubhechhaClaes, DieterDieterClaesvan Setten, MichielMichielvan SettenMitard, JeromeJeromeMitardDelhougne, RomainRomainDelhougneAfanasiev, ValeriValeriAfanasievKaczer, BenBenKaczerKar, Gouri SankarGouri SankarKar2022-08-252022-07-092022-08-2520212380-9248WOS:000812325400167https://imec-publications.be/handle/20.500.12860/40077Understanding and modelling the PBTI reliability of thin-film IGZO transistorsProceedings paper10.1109/IEDM19574.2021.9720666978-1-6654-2572-8WOS:000812325400167