Stochastic collocation for device-level variability analysis in integrated photonics

Xing, YufeiYufeiXingSpina, DomenicoDomenicoSpinaLi, AngAngLiDhaene, TomTomDhaeneBogaerts, WimWimBogaerts2021-10-232021-10-232016-032327-9125https://imec-publications.be/handle/20.500.12860/27615Stochastic collocation for device-level variability analysis in integrated photonicsJournal articlehttps://www.osapublishing.org/prj/abstract.cfm?uri=prj-4-2-93