Vanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenKaniava, ArvydasArvydasKaniavaLibezny, MilanMilanLibeznyClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/977Impact of oxygen related extended defects on silicon diode characteristicsJournal article